Document Type: Original Research Article


1 Physics, Young Researchers Club and Elites, Islamic azad university, sanandaj branch, sanandaj, iran

2 Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran


Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope ( AFM ) tip was investigated . The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.

Graphical Abstract


Main Subjects

[1] C.K. Hyon, S.C. Choi, S.W. Hwang, D.Ahn, Y. Kim, E.K. Kim, Appl. Phys. Lett., 1999, 75, 292–294.

[2] D. Klinov, S.N. Magonov,Appl. Phys. Lett., 2004, 84, 2697-2699.

[3] F. Giessibl, Science, 1995, 267, 68-71.

[4] Modern Aspects of Bulk Crystal and Thin Film Preparation, Chapter title, H.R.Aghabozorg, S.SadeghHassani and F. Salehirad, Intechweb publisher, January, 2012.

[5] Recent Advances in Nanofabrication Techniques and Applications, S. SadeghHassani and H.R. Aghabozorg, Intechweb publisher, December, 2011.

[6] Sundararajan, S. &Bhushan, B. (2000). Journal of Applied Physics, 88(8), 4825.

[7] N.A. Burnham, R.J.  Colton, H.M.  Pollock,Journal of Vacuum Science &Technology A: Vacuum, Surfaces, and Films, 1991, 9(4), 2548-2556.

[8]  J.P. Aime, Z. Elkaakour, C. Odin, T. Bouhacina, D. Michel, J. Curely, A. Dautant, Journal of Applied Physics, 1994, 76, 754-762.

[9] S.N. Magonov, D.H. Reneker, Ann. Rev. Mater. Sci., 1997, 27, 175-222.

[10] J.K. Hobbs, N. Mullin,Ch.H.M. Weber, O.E. Farrance, C.Vasilev, Materials today, 2009, 12, 7-8, 26-33.

[11] G.J. Leggett, N.J. Brewer, K.S.L Chong,Phys. Chem. Chem. Phys., 2005 7(6), 1107-1120.

[12] A. Cadby, R. Dean, A.M Fox, R.A.L. Jones, D. GLidzey, Nanoletters, 2005, 5(11), 2232-7.

[13] J.K. Hobbs, Progress in Understanding of Polymer Crystallization, Lecture Notes in Physics, 2007, 714, 151-168.

[14] G. Binnig, H. Rohrer, Nobel lecture, 1986 30, 389-409.

[15] D. Saridt, Exploring Scanning probe microscopy with mathematics, Viley-VCH publisher, 2007.

[16] H. Hopster, H.P.Oepen (Eds.) Magnetic Microscopy of nanostructures, Springer, 2003.

[17] D. Rugar, H. Mamin, P. Guethner, S. Lambert, J. Stern, I. McFadyen, and T. Yogi, Journal of Applied Physics, 1990, 68( 3), 1169–1183.

[18] H. Hopster, H.P. Oepen, Magnetic Microscopy of Nanostructures, 2005, 11-12.

[19] J. afzali, Z. alemipour, M. Hesam, International Journal of Engineering (IJE), Transactions A: Basics, 2013, 26(4), 567-568.

[20] I. Thomas Clark, M. Yoshimura, Electronic properties of carbon nanotube, Fabrication of Carbon Nanotubes for High-Performance Scanning Probe Microscopy,  Publisher In Tech, 2011, 91-104.

[21] K. Tanaka, M. Yoshimura, K. Ueda, Journal of Nanomaterials, 2009, 4.

[22] H. Kuramochi, T. Uzumaki, M. Yasutake, A.Tanaka, H. Akinaga, H. Yokoyama, Nanotechnology, 2005, 16, (1) , 24-27.

[23] H. Kuramochi, H. Akinaga, Y.Semba, M. Kijima, T. Uzumaki, M. Yasutake, A. Tanaka, H. Yokoyama, Japanese journal of applied Physics,2005, 44 (4A) 1, 2077-2080.

[24] Z. Deng, E. Yenilmez, J. Leu, J.E. Hoffman, E.W.J. Straver, H. Dai, K.A. Moler, Applied Physics Letters, 2004, 85(25), 6263-6265.

[25] A. Winkler, T. Muhl, S. Menzel, R.K. Koseva, S. Hampel, A. Leonhardt, B. Buchner, Journal of Applied Physics, 2006, 99(10).

[26] T. Arie, H. Nishijima, S. Akita, Y.Nakayama, Journal of Vacuum Science and Technology B, 2000, 118(1), 104-106.

[27] N. Yoshida, M.Yasutake, T. Arie, S. Akita and Y. Nakayama, Japanese Journal of Applied Physics, 2002, 41(7B), 5013-5016.

[28] J.H. Hafner, C.L. Cheung, C.M. Lieber, J. Am. Chem. Soc., 1999, 121, 9750–9751.

[29] J. Tang, B. Gao, H. Geng, O.D. Velev, L Qin, O. Zhou, Adv. Mater(Weinheim, Ger), 2003, 15, 1352.

[30] J. Zhang, J. Tang, G. Yang, Q. Qiu, L. Qin, and O. Zhou, Adv. Mater. (Weinheim, Ger), 2004, 16, 1219.

[31] A.M.Rashidi, M.M. Akbarnejad, A.A. Khodadadi, Y. Mortazavi, A. Ahmadpourd, Nanotechnology, 2007, 18, 315605.

[32] H.A. Pohl, Dielectrophoresis: The behavior of Neutral Matter in Nonuniform Electric Field, Cambridge University Press, 1978.

[33]T.B. Jones, Electromechanics of Particles, Cambridge University Press, 1995.