TY - JOUR ID - 1259 TI - Magnetic force microscopy using fabricated cobalt-coated carbon nanotubes probes JO - Iranian chemical communication JA - ICC LA - en SN - 2423-4958 AU - Afzali, Jamal AU - Sadegh Hassani, Sedigheh AD - Physics, Young Researchers Club and Elites, Islamic azad university, sanandaj branch, sanandaj, iran AD - Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran Y1 - 2015 PY - 2015 VL - 3 IS - Issue 3, pp. 180-282,Serial No. 8 SP - 266 EP - 275 KW - Magnetic force microscope KW - dielectrophoresis KW - carbon nanotube probe KW - MFM probe DO - N2 - Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope ( AFM ) tip was investigated . The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images. UR - https://icc.journals.pnu.ac.ir/article_1259.html L1 - https://icc.journals.pnu.ac.ir/article_1259_5be52a8b9030ea9fd03fad1ae879ad17.pdf ER -