1Physics, Young Researchers Club and Elites, Islamic azad university, sanandaj branch, sanandaj, iran
2Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: 1485733111, Tehran, Iran
Magnetic force microscope ( MFM ) is a powerful technique for mapping the magnetic force gradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used to fabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effective technique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT) on the atomic force microscope ( AFM ) tip was investigated . The optimum voltage and frequency of SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theas-prepared CNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.